Measurement Equipment
TDC owns a wide range of high-performance measurement instruments from trusted manufacturers, ensuring the precision and quality of its ultra-precision polishing and ultra-precision machining.
※ TDC’s measuring instrument is set in 3 rooms which are temperature-controlled (21 +/- 1 degrees and 21 +/- 2 degrees). [Celsius]
We also accept requests for precision measurement only.
Please feel free to contact us.
Contents
Surface Roughness
| Model | Instrument Type | Manufacturer | Measuring Range | Measurement Target |
| Talysurf CCI 3000 Sunstar | White Light Interferometer | Taylor Hobson | 150×258mm | Surface Roughness |
| NewView™ 9000 | White Light Interferometer | Zygo | 150×150mm | Surface Roughness / Flatness |
| SJ400 | Contact-type Surface Profilometer | Mitutoyo | – | Surface Roughness |
| Dimension Icon SPM System |
AFM (Atomic Force Microscope) | Bruker | Max. 8 inches | Surface Roughness |
Flatness
| Model | Instrument Type | Manufacturer | Measuring Range | Measurement Target |
| NewView™ 9000 | White Light Interferometer | Zygo | 150×150mm | Surface Roughness / Flatness |
| Verifire™ MST | Laser Interferometer | Zygo | Max. 18 inches | Flatness |
| Verifire™ XL | Laser Interferometer | Zygo | φ300 | Flatness |
| FT-200U/FT-100U | Laser Interferometer | Mizojiri Optical | φ200・φ100 | Flatness |
| FT-200S | Fizeau Interferometer | Mizojiri Optical | φ200 | Flatness |
| LEGEX9106 | CMM (Coordinate Measuring Machine) | Mitutoyo | 900×1000×600 |
Dimensions / Parallelism / |
| CRYSTA-Apex S7106 | CMM (Coordinate Measuring Machine) | Mitutoyo | 700×1000×600 | Dimensions / Parallelism / Angle / Flatness |
| CRYSTA-Apex S544 | CMM (Coordinate Measuring Machine) | Mitutoyo | 500×400×400 | Dimensions / Parallelism / Angle / Flatness |
Mitutoyo LEGEX9106Dimensions / Parallelism / Angle
| Model | Instrument Type | Manufacturer | Measuring Range | Measurement Target |
| LEGEX9106 | CMM (Coordinate Measuring Machine) | Mitutoyo | 900×1000×600 |
Dimensions / Parallelism / |
| CRYSTA-Apex S7106 | CMM (Coordinate Measuring Machine) | Mitutoyo | 700×1000×600 | Dimensions / Parallelism / Angle / Flatness |
| CRYSTA-Apex S544 | CMM (Coordinate Measuring Machine) | Mitutoyo | 500×400×400 | Dimensions / Parallelism / Angle / Flatness |
| MF-UB2010D | Measuring Microscope | Mitutoyo | 200×100 | Dimensions / Parallelism / Angle |
| GT2-H12KL | High-precision Contact-type Digital Sensor | Keyence | – | Dimensions / Parallelism |
| LM-1000/LM-1100 | Video Measurement Machine | Keyence | 200×100×75※ | Dimensions |
※The measurable range may vary depending on fixture setup and part geometry.
Film Thickness Measurement
| Model | Instrument Type | Manufacturer | Measuring Range | Measurement Target |
| C13027（Optical NanoGauge） | Spectral Interference Film Thickness Measurement System | Hamamatsu Photonics | φ200 | Film Thickness |
Optical NanoGauge
Roundness
| Model | Instrument Type | Manufacturer | Measuring Range | Measurement Target |
| Talyrond 395 | High-Precision Roundness Measuring Machine | Taylor Hobson | Φ300×500mm※ | Roundness |
※May vary depending on fixture setup conditions.
Magnification Microscope
| Model | Instrument Type | Manufacturer | Measuring Range | Measurement Target |
| VHX-6000 | Digital Microscope | Keyence | 100×100mm | Surface Observation |
TDC Information
